%0 Conference Paper %1 conf/ats/AzevedoVBDGTPAM12 %A Azevedo, Joao %A Virazel, Arnaud %A Bosio, Alberto %A Dilillo, Luigi %A Girard, Patrick %A Todri, Aida %A Prenat, Guillaume %A Alvarez-Herault, Jérémy %A Mackay, Ken %B Asian Test Symposium %D 2012 %I IEEE Computer Society %K dblp %P 125-130 %T Impact of Resistive-Bridge Defects in TAS-MRAM Architectures. %U http://dblp.uni-trier.de/db/conf/ats/ats2012.html#AzevedoVBDGTPAM12 %@ 978-1-4673-4555-2

@inproceedings{conf/ats/AzevedoVBDGTPAM12, added-at = {2023-03-24T00:00:00.000+0100}, author = {Azevedo, Joao and Virazel, Arnaud and Bosio, Alberto and Dilillo, Luigi and Girard, Patrick and Todri, Aida and Prenat, Guillaume and Alvarez-Herault, Jérémy and Mackay, Ken}, biburl = {https://www.bibsonomy.org/bibtex/2b00072c769db141ef1994de011b83325/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2012}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2012.37}, interhash = {073dd4993cc058f5e591ffe553e37d68}, intrahash = {b00072c769db141ef1994de011b83325}, isbn = {978-1-4673-4555-2}, keywords = {dblp}, pages = {125-130}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:36:33.000+0200}, title = {Impact of Resistive-Bridge Defects in TAS-MRAM Architectures.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2012.html#AzevedoVBDGTPAM12}, year = 2012 }