%0 Journal Article %1 journals/mr/SeoLKLHY05 %A Seo, J. Y. %A Lee, K. J. %A Kim, Y. S. %A Lee, S. Y. %A Hwang, S. J. %A Yoon, C. K. %D 2005 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1317-1320 %T Reliability for Recessed Channel Structure n-MOSFET. %U http://dblp.uni-trier.de/db/journals/mr/mr45.html#SeoLKLHY05 %V 45

@article{journals/mr/SeoLKLHY05, added-at = {2020-02-22T00:00:00.000+0100}, author = {Seo, J. Y. and Lee, K. J. and Kim, Y. S. and Lee, S. Y. and Hwang, S. J. and Yoon, C. K.}, biburl = {https://www.bibsonomy.org/bibtex/2672d44c9b0180e149711b8b9111b9e8e/dblp}, ee = {https://doi.org/10.1016/j.microrel.2005.07.013}, interhash = {09b2fda7c890f0536fe5a7855bc5e213}, intrahash = {672d44c9b0180e149711b8b9111b9e8e}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1317-1320}, timestamp = {2020-02-25T13:23:02.000+0100}, title = {Reliability for Recessed Channel Structure n-MOSFET.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr45.html#SeoLKLHY05}, volume = 45, year = 2005 }