%0 Journal Article %1 journals/ieicet/MiyazakiHDMF04 %A Miyazaki, Masahide %A Hosokawa, Toshinori %A Date, Hiroshi %A Muraoka, Michiaki %A Fujiwara, Hideo %D 2004 %J IEICE Trans. Inf. Syst. %K dblp %N 3 %P 609-619 %T A DFT Selection Method for Reducing Test Application Time of System-on-Chips. %U http://dblp.uni-trier.de/db/journals/ieicet/ieicet87d.html#MiyazakiHDMF04 %V 87-D

@article{journals/ieicet/MiyazakiHDMF04, added-at = {2020-04-11T00:00:00.000+0200}, author = {Miyazaki, Masahide and Hosokawa, Toshinori and Date, Hiroshi and Muraoka, Michiaki and Fujiwara, Hideo}, biburl = {https://www.bibsonomy.org/bibtex/2693a90cc5d8cbe4360c69820233bad98/dblp}, ee = {http://search.ieice.org/bin/summary.php?id=e87-d_3_609}, interhash = {0ee49ea098b8473f2101e423aa34f2e9}, intrahash = {693a90cc5d8cbe4360c69820233bad98}, journal = {IEICE Trans. Inf. Syst.}, keywords = {dblp}, number = 3, pages = {609-619}, timestamp = {2020-04-14T12:00:36.000+0200}, title = {A DFT Selection Method for Reducing Test Application Time of System-on-Chips.}, url = {http://dblp.uni-trier.de/db/journals/ieicet/ieicet87d.html#MiyazakiHDMF04}, volume = {87-D}, year = 2004 }