%0 Journal Article %1 journals/mr/Djoric-VeljkovicMDGS03 %A Djoric-Veljkovic, Snezana %A Manic, Ivica %A Davidovic, Vojkan %A Golubovic, Snezana %A Stojadinovic, Ninoslav %D 2003 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1455-1460 %T Effects of burn-in stressing on post-irradiation annealing response of power VDMOSFETs. %U http://dblp.uni-trier.de/db/journals/mr/mr43.html#Djoric-VeljkovicMDGS03 %V 43

@article{journals/mr/Djoric-VeljkovicMDGS03, added-at = {2023-09-30T00:00:00.000+0200}, author = {Djoric-Veljkovic, Snezana and Manic, Ivica and Davidovic, Vojkan and Golubovic, Snezana and Stojadinovic, Ninoslav}, biburl = {https://www.bibsonomy.org/bibtex/2164e6ce8d6317a0eeb13d38f9af16c63/dblp}, ee = {https://doi.org/10.1016/S0026-2714(03)00258-0}, interhash = {11013f75e3763b846638a418c27758c2}, intrahash = {164e6ce8d6317a0eeb13d38f9af16c63}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1455-1460}, timestamp = {2024-04-09T02:50:51.000+0200}, title = {Effects of burn-in stressing on post-irradiation annealing response of power VDMOSFETs.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr43.html#Djoric-VeljkovicMDGS03}, volume = 43, year = 2003 }