%0 Journal Article %1 journals/tvlsi/SirichotiyakulEOPB02 %A Sirichotiyakul, Supamas %A Edwards, Tim %A Oh, Chanhee %A Panda, Rajendran %A Blaauw, David T. %D 2002 %J IEEE Trans. Very Large Scale Integr. Syst. %K dblp %N 2 %P 79-90 %T Duet: an accurate leakage estimation and optimization tool for dual-Vt circuits. %U http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi10.html#SirichotiyakulEOPB02 %V 10

@article{journals/tvlsi/SirichotiyakulEOPB02, added-at = {2020-03-11T00:00:00.000+0100}, author = {Sirichotiyakul, Supamas and Edwards, Tim and Oh, Chanhee and Panda, Rajendran and Blaauw, David T.}, biburl = {https://www.bibsonomy.org/bibtex/2e83713abbfb36de253561a1b56925fdf/dblp}, ee = {https://doi.org/10.1109/92.994980}, interhash = {11ce25932f77c2fb75089c7c0738a5e4}, intrahash = {e83713abbfb36de253561a1b56925fdf}, journal = {IEEE Trans. Very Large Scale Integr. Syst.}, keywords = {dblp}, number = 2, pages = {79-90}, timestamp = {2020-03-12T11:44:07.000+0100}, title = {Duet: an accurate leakage estimation and optimization tool for dual-Vt circuits.}, url = {http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi10.html#SirichotiyakulEOPB02}, volume = 10, year = 2002 }