Inproceedings,
Device-Aware Test for Back-Hopping Defects in STT-MRAMs.
S. Yuan, M. Taouil, M. Fieback, H. Xun, E. Marinissen, G. Kar, S. Rao, S. Couet, and S. Hamdioui.DATE, page 1-6. IEEE, (2023)
Meta data
- BibTeX key
- conf/date/YuanTFXMKRCH23
- entry type
- inproceedings
- booktitle
- DATE
- year
- 2023
- pages
- 1-6
- publisher
- IEEE
- crossref
- conf/date/2023
- ee
- https://doi.org/10.23919/DATE56975.2023.10137071
- isbn
- 978-3-9819263-7-8
- url
- http://dblp.uni-trier.de/db/conf/date/date2023.html#YuanTFXMKRCH23
Tags
Users
Comments and Reviewsshow / hide
Cite this publication
More citation styles
- please select -%0 Conference Paper
%1 conf/date/YuanTFXMKRCH23
%A Yuan, Sicong
%A Taouil, Mottaqiallah
%A Fieback, Moritz
%A Xun, Hanzhi
%A Marinissen, Erik Jan
%A Kar, Gouri Sankar
%A Rao, Sidharth
%A Couet, Sebastien
%A Hamdioui, Said
%B DATE
%D 2023
%I IEEE
%K dblp
%P 1-6
%T Device-Aware Test for Back-Hopping Defects in STT-MRAMs.
%U http://dblp.uni-trier.de/db/conf/date/date2023.html#YuanTFXMKRCH23
%@ 978-3-9819263-7-8
@inproceedings{conf/date/YuanTFXMKRCH23,
added-at = {2023-09-30T00:00:00.000+0200},
author = {Yuan, Sicong and Taouil, Mottaqiallah and Fieback, Moritz and Xun, Hanzhi and Marinissen, Erik Jan and Kar, Gouri Sankar and Rao, Sidharth and Couet, Sebastien and Hamdioui, Said},
biburl = {https://www.bibsonomy.org/bibtex/2d0bec12124deee40f1795a34c4939d85/dblp},
booktitle = {DATE},
crossref = {conf/date/2023},
ee = {https://doi.org/10.23919/DATE56975.2023.10137071},
interhash = {125e4dffae36f05bd34779cd2ea88030},
intrahash = {d0bec12124deee40f1795a34c4939d85},
isbn = {978-3-9819263-7-8},
keywords = {dblp},
pages = {1-6},
publisher = {IEEE},
timestamp = {2024-04-09T12:36:17.000+0200},
title = {Device-Aware Test for Back-Hopping Defects in STT-MRAMs.},
url = {http://dblp.uni-trier.de/db/conf/date/date2023.html#YuanTFXMKRCH23},
year = 2023
}