%0 Journal Article %1 journals/et/GuFNZM17 %A Gu, Junjie %A Fu, Haipeng %A Na, Weicong %A Zhang, Qijun %A Ma, Jianguo %D 2017 %J J. Electron. Test. %K dblp %N 1 %P 133-140 %T Fast and Automated Electromigration Analysis for CMOS RF PA Design. %U http://dblp.uni-trier.de/db/journals/et/et33.html#GuFNZM17 %V 33

@article{journals/et/GuFNZM17, added-at = {2020-09-11T00:00:00.000+0200}, author = {Gu, Junjie and Fu, Haipeng and Na, Weicong and Zhang, Qijun and Ma, Jianguo}, biburl = {https://www.bibsonomy.org/bibtex/252695e6ddfa99eb7f230b0c98ca8e45d/dblp}, ee = {https://doi.org/10.1007/s10836-016-5639-4}, interhash = {136458d46bcd231f0d7cd8453cf9fd06}, intrahash = {52695e6ddfa99eb7f230b0c98ca8e45d}, journal = {J. Electron. Test.}, keywords = {dblp}, number = 1, pages = {133-140}, timestamp = {2020-09-12T11:40:48.000+0200}, title = {Fast and Automated Electromigration Analysis for CMOS RF PA Design.}, url = {http://dblp.uni-trier.de/db/journals/et/et33.html#GuFNZM17}, volume = 33, year = 2017 }