Please log in to take part in the discussion (add own reviews or comments).
Cite this publication
More citation styles
- please select -
%0 Conference Paper
%1 conf/vlsit/KimSPJYLPLNAH23
%A Kim, Kyungmoon
%A Seo, Yujeong
%A Park, Sejun
%A Jang, Woojae
%A Yoo, Dongho
%A Lim, Joonsung
%A Park, Il-Han
%A Lee, Jaeduk
%A Noh, Kyungyoon
%A Ahn, Sujin
%A Hur, Sunghoi
%B VLSI Technology and Circuits
%D 2023
%I IEEE
%K dblp
%P 1-2
%T High Bit Cost Scalability and Reliable Cell Characteristics for 7th Generation 1Tb 4Bit/Cell 3D-NAND Flash.
%U http://dblp.uni-trier.de/db/conf/vlsit/vlsit2023.html#KimSPJYLPLNAH23
%@ 978-4-86348-806-9
@inproceedings{conf/vlsit/KimSPJYLPLNAH23,
added-at = {2023-07-28T00:00:00.000+0200},
author = {Kim, Kyungmoon and Seo, Yujeong and Park, Sejun and Jang, Woojae and Yoo, Dongho and Lim, Joonsung and Park, Il-Han and Lee, Jaeduk and Noh, Kyungyoon and Ahn, Sujin and Hur, Sunghoi},
biburl = {https://www.bibsonomy.org/bibtex/24562565bf49df7c5a065720056bd84ff/dblp},
booktitle = {VLSI Technology and Circuits},
crossref = {conf/vlsit/2023},
ee = {https://doi.org/10.23919/VLSITechnologyandCir57934.2023.10185404},
interhash = {145396b4dacd5c7a12086ee23c246e63},
intrahash = {4562565bf49df7c5a065720056bd84ff},
isbn = {978-4-86348-806-9},
keywords = {dblp},
pages = {1-2},
publisher = {IEEE},
timestamp = {2024-04-09T19:13:01.000+0200},
title = {High Bit Cost Scalability and Reliable Cell Characteristics for 7th Generation 1Tb 4Bit/Cell 3D-NAND Flash.},
url = {http://dblp.uni-trier.de/db/conf/vlsit/vlsit2023.html#KimSPJYLPLNAH23},
year = 2023
}