%0 Conference Paper %1 conf/irps/ChungKH18 %A Chung, C. %A Kobayashi, D. %A Hirose, K. %B IRPS %D 2018 %I IEEE %K dblp %P 4 %T Threshold ion parameters of line-type soft-errors in biased thin-BOX SOI SRAMs: Difference between sensitivities to terrestrial and space radiation. %U http://dblp.uni-trier.de/db/conf/irps/irps2018.html#ChungKH18 %@ 978-1-5386-5479-8

@inproceedings{conf/irps/ChungKH18, added-at = {2019-01-22T00:00:00.000+0100}, author = {Chung, C. and Kobayashi, D. and Hirose, K.}, biburl = {https://www.bibsonomy.org/bibtex/2fd9ca0eb9f2d76b92dacb8f42b82f1d0/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2018}, ee = {https://doi.org/10.1109/IRPS.2018.8353585}, interhash = {155c4fa4b02bf59965a50cdefc23be5b}, intrahash = {fd9ca0eb9f2d76b92dacb8f42b82f1d0}, isbn = {978-1-5386-5479-8}, keywords = {dblp}, pages = 4, publisher = {IEEE}, timestamp = {2019-10-17T14:45:36.000+0200}, title = {Threshold ion parameters of line-type soft-errors in biased thin-BOX SOI SRAMs: Difference between sensitivities to terrestrial and space radiation.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2018.html#ChungKH18}, year = 2018 }