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%0 Conference Paper
%1 conf/ic3k/KoutroulisSWFKT20
%A Koutroulis, Georgios
%A Santos, Tiago
%A Wiedemann, Michael
%A Faistauer, Christian
%A Kern, Roman
%A Thalmann, Stefan
%B KDIR
%D 2020
%E Fred, Ana L. N.
%E Filipe, Joaquim
%I SCITEPRESS
%K dblp
%P 269-276
%T Enhanced Active Learning of Convolutional Neural Networks: A Case Study for Defect Classification in the Semiconductor Industry.
%U http://dblp.uni-trier.de/db/conf/ic3k/kdir2020.html#KoutroulisSWFKT20
%@ 978-989-758-474-9
@inproceedings{conf/ic3k/KoutroulisSWFKT20,
added-at = {2021-04-09T00:00:00.000+0200},
author = {Koutroulis, Georgios and Santos, Tiago and Wiedemann, Michael and Faistauer, Christian and Kern, Roman and Thalmann, Stefan},
biburl = {https://www.bibsonomy.org/bibtex/29f2cf0cbd9226cc82452556348ee197f/dblp},
booktitle = {KDIR},
crossref = {conf/ic3k/2020kdir},
editor = {Fred, Ana L. N. and Filipe, Joaquim},
ee = {https://doi.org/10.5220/0010142902690276},
interhash = {167cd853b84b91bf7ddf448499571a3a},
intrahash = {9f2cf0cbd9226cc82452556348ee197f},
isbn = {978-989-758-474-9},
keywords = {dblp},
pages = {269-276},
publisher = {SCITEPRESS},
timestamp = {2024-04-09T23:25:29.000+0200},
title = {Enhanced Active Learning of Convolutional Neural Networks: A Case Study for Defect Classification in the Semiconductor Industry.},
url = {http://dblp.uni-trier.de/db/conf/ic3k/kdir2020.html#KoutroulisSWFKT20},
year = 2020
}