%0 Journal Article %1 journals/access/KimKB19 %A Kim, Seong-Joon %A Kim, Man Soo %A Bae, Suk Joo %D 2019 %J IEEE Access %K dblp %P 143160-143168 %T Reliability Prediction of Highly Scaled MOSFET Devices via Fractal Structure of Spatial Defects. %U http://dblp.uni-trier.de/db/journals/access/access7.html#KimKB19 %V 7

@article{journals/access/KimKB19, added-at = {2019-11-07T00:00:00.000+0100}, author = {Kim, Seong-Joon and Kim, Man Soo and Bae, Suk Joo}, biburl = {https://www.bibsonomy.org/bibtex/2cef595213a1eac7a3582e2b703962bf5/dblp}, ee = {https://doi.org/10.1109/ACCESS.2019.2944955}, interhash = {1864ad7216b7a74a1ba59cf06f12fa03}, intrahash = {cef595213a1eac7a3582e2b703962bf5}, journal = {IEEE Access}, keywords = {dblp}, pages = {143160-143168}, timestamp = {2019-11-08T11:40:46.000+0100}, title = {Reliability Prediction of Highly Scaled MOSFET Devices via Fractal Structure of Spatial Defects.}, url = {http://dblp.uni-trier.de/db/journals/access/access7.html#KimKB19}, volume = 7, year = 2019 }