Пожалуйста, войдите в систему, чтобы принять участие в дискуссии (добавить собственные рецензию, или комментарий)
Цитировать эту публикацию
%0 Journal Article
%1 journals/jolpe/WangSKT15
%A Wang, Senling
%A Sato, Yasuo
%A Kajihara, Seiji
%A Takahashi, Hiroshi
%D 2015
%J J. Low Power Electron.
%K dblp
%N 4
%P 528-540
%T Physical Power Evaluation of Low Power Logic-BIST Scheme Using Test Element Group Chip.
%U http://dblp.uni-trier.de/db/journals/jolpe/jolpe11.html#WangSKT15
%V 11
@article{journals/jolpe/WangSKT15,
added-at = {2020-05-22T00:00:00.000+0200},
author = {Wang, Senling and Sato, Yasuo and Kajihara, Seiji and Takahashi, Hiroshi},
biburl = {https://www.bibsonomy.org/bibtex/20d08921c0ef61d7284e18b0cc2e1226e/dblp},
ee = {https://doi.org/10.1166/jolpe.2015.1410},
interhash = {1913c8cbae86e0b4c471c8eced770b11},
intrahash = {0d08921c0ef61d7284e18b0cc2e1226e},
journal = {J. Low Power Electron.},
keywords = {dblp},
number = 4,
pages = {528-540},
timestamp = {2020-05-23T12:25:39.000+0200},
title = {Physical Power Evaluation of Low Power Logic-BIST Scheme Using Test Element Group Chip.},
url = {http://dblp.uni-trier.de/db/journals/jolpe/jolpe11.html#WangSKT15},
volume = 11,
year = 2015
}
