%0 Journal Article %1 journals/tie/JahdiHSM20 %A Jahdi, Saeed %A Hedayati, Mohammad %A Stark, Bernard H. %A Mellor, Phil H. %D 2020 %J IEEE Trans. Ind. Electron. %K dblp %N 6 %P 4556-4566 %T The Impact of Temperature and Switching Rate on Dynamic Transients of High-Voltage Silicon and 4H-SiC NPN BJTs: A Technology Evaluation. %U http://dblp.uni-trier.de/db/journals/tie/tie67.html#JahdiHSM20 %V 67

@article{journals/tie/JahdiHSM20, added-at = {2020-05-22T00:00:00.000+0200}, author = {Jahdi, Saeed and Hedayati, Mohammad and Stark, Bernard H. and Mellor, Phil H.}, biburl = {https://www.bibsonomy.org/bibtex/2deb67183aac055e2c5d0b0d301d126ba/dblp}, ee = {https://doi.org/10.1109/TIE.2019.2922918}, interhash = {1b2430851d844cb0d0e7224cdd622d07}, intrahash = {deb67183aac055e2c5d0b0d301d126ba}, journal = {IEEE Trans. Ind. Electron.}, keywords = {dblp}, number = 6, pages = {4556-4566}, timestamp = {2020-05-23T11:43:51.000+0200}, title = {The Impact of Temperature and Switching Rate on Dynamic Transients of High-Voltage Silicon and 4H-SiC NPN BJTs: A Technology Evaluation.}, url = {http://dblp.uni-trier.de/db/journals/tie/tie67.html#JahdiHSM20}, volume = 67, year = 2020 }