%0 Conference Paper %1 conf/asicon/WangJZR11 %A Wang, Lei %A Jiang, Jianhua %A Zhou, Yumei %A Ren, Gaofeng %B ASICON %D 2011 %I IEEE %K dblp %P 240-243 %T A new scheme for testability improvement of ECC incorporated memory. %U http://dblp.uni-trier.de/db/conf/asicon/asicon2011.html#WangJZR11 %@ 978-1-61284-192-2

@inproceedings{conf/asicon/WangJZR11, added-at = {2016-06-22T00:00:00.000+0200}, author = {Wang, Lei and Jiang, Jianhua and Zhou, Yumei and Ren, Gaofeng}, biburl = {https://www.bibsonomy.org/bibtex/20c1bb7d86efafe594f4d20e2d52a75e8/dblp}, booktitle = {ASICON}, crossref = {conf/asicon/2011}, ee = {http://dx.doi.org/10.1109/ASICON.2011.6157166}, interhash = {1b7cb707d8e079685d0c53dcfcdb03ef}, intrahash = {0c1bb7d86efafe594f4d20e2d52a75e8}, isbn = {978-1-61284-192-2}, keywords = {dblp}, pages = {240-243}, publisher = {IEEE}, timestamp = {2016-06-23T11:39:00.000+0200}, title = {A new scheme for testability improvement of ECC incorporated memory.}, url = {http://dblp.uni-trier.de/db/conf/asicon/asicon2011.html#WangJZR11}, year = 2011 }