%0 Journal Article %1 journals/mr/SetoyaOSME15 %A Setoya, Takashi %A Ogura, Tsuneo %A Saito, Wataru %A Matsudai, Tomoko %A Endo, Koichi %D 2015 %J Microelectron. Reliab. %K dblp %N 9-10 %P 1932-1937 %T Destruction failure analysis and international reliability test standard for power devices. %U http://dblp.uni-trier.de/db/journals/mr/mr55.html#SetoyaOSME15 %V 55

@article{journals/mr/SetoyaOSME15, added-at = {2021-10-14T00:00:00.000+0200}, author = {Setoya, Takashi and Ogura, Tsuneo and Saito, Wataru and Matsudai, Tomoko and Endo, Koichi}, biburl = {https://www.bibsonomy.org/bibtex/2d863d32d97377d8eab8ef34da2442229/dblp}, ee = {https://doi.org/10.1016/j.microrel.2015.07.042}, interhash = {1ba95078d4d59db35cee62d5a7e2cf7a}, intrahash = {d863d32d97377d8eab8ef34da2442229}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-10}, pages = {1932-1937}, timestamp = {2024-04-09T02:50:06.000+0200}, title = {Destruction failure analysis and international reliability test standard for power devices.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr55.html#SetoyaOSME15}, volume = 55, year = 2015 }