%0 Journal Article %1 journals/mr/DattaLN14 %A Datta, Suman %A Liu, Huichu %A Narayanan, Vijaykrishnan %D 2014 %J Microelectron. Reliab. %K dblp %N 5 %P 861-874 %T Tunnel FET technology: A reliability perspective. %U http://dblp.uni-trier.de/db/journals/mr/mr54.html#DattaLN14 %V 54

@article{journals/mr/DattaLN14, added-at = {2020-02-22T00:00:00.000+0100}, author = {Datta, Suman and Liu, Huichu and Narayanan, Vijaykrishnan}, biburl = {https://www.bibsonomy.org/bibtex/2ae402c06422ab96de5df2cda74aeb1ec/dblp}, ee = {https://doi.org/10.1016/j.microrel.2014.02.002}, interhash = {1dd6bb2e23be89cdd34e1df2d4e93e73}, intrahash = {ae402c06422ab96de5df2cda74aeb1ec}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 5, pages = {861-874}, timestamp = {2020-02-25T13:28:53.000+0100}, title = {Tunnel FET technology: A reliability perspective.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr54.html#DattaLN14}, volume = 54, year = 2014 }