%0 Conference Paper %1 conf/iccel/TsaiL20 %A Tsai, Tsung-Han %A Lee, Yu-Chen %B ICCE %D 2020 %I IEEE %K dblp %P 1-3 %T Wafer Map Defect Classification with Depthwise Separable Convolutions. %U http://dblp.uni-trier.de/db/conf/iccel/icce2020.html#TsaiL20 %@ 978-1-7281-5186-1

@inproceedings{conf/iccel/TsaiL20, added-at = {2020-03-30T00:00:00.000+0200}, author = {Tsai, Tsung-Han and Lee, Yu-Chen}, biburl = {https://www.bibsonomy.org/bibtex/22451c4c0ea82df81640c477f09c6ecd7/dblp}, booktitle = {ICCE}, crossref = {conf/iccel/2020}, ee = {https://doi.org/10.1109/ICCE46568.2020.9043041}, interhash = {23162206a55415a466e494b804a96ab0}, intrahash = {2451c4c0ea82df81640c477f09c6ecd7}, isbn = {978-1-7281-5186-1}, keywords = {dblp}, pages = {1-3}, publisher = {IEEE}, timestamp = {2020-03-31T11:41:26.000+0200}, title = {Wafer Map Defect Classification with Depthwise Separable Convolutions.}, url = {http://dblp.uni-trier.de/db/conf/iccel/icce2020.html#TsaiL20}, year = 2020 }