%0 Conference Paper %1 conf/itc/MacDonaldT99 %A MacDonald, Eric W. %A Touba, Nur A. %B ITC %D 1999 %I IEEE Computer Society %K dblp %P 269-275 %T Delay testing of SOI circuits: Challenges with the history effect. %U http://dblp.uni-trier.de/db/conf/itc/itc1999.html#MacDonaldT99 %@ 0-7803-5753-1

@inproceedings{conf/itc/MacDonaldT99, added-at = {2023-03-23T00:00:00.000+0100}, author = {MacDonald, Eric W. and Touba, Nur A.}, biburl = {https://www.bibsonomy.org/bibtex/2f21dcea61b6bb0adea45414217c398a0/dblp}, booktitle = {ITC}, crossref = {conf/itc/1999}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.1999.805640}, interhash = {29064c0bf5ad0061c69c36c4fafc85b5}, intrahash = {f21dcea61b6bb0adea45414217c398a0}, isbn = {0-7803-5753-1}, keywords = {dblp}, pages = {269-275}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T19:53:23.000+0200}, title = {Delay testing of SOI circuits: Challenges with the history effect.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1999.html#MacDonaldT99}, year = 1999 }