%0 Journal Article %1 journals/et/NambaI10 %A Namba, Kazuteru %A Ito, Hideo %D 2010 %J J. Electron. Test. %K dblp %N 6 %P 667-677 %T Chiba Scan Delay Fault Testing with Short Test Application Time. %U http://dblp.uni-trier.de/db/journals/et/et26.html#NambaI10 %V 26

@article{journals/et/NambaI10, added-at = {2020-09-11T00:00:00.000+0200}, author = {Namba, Kazuteru and Ito, Hideo}, biburl = {https://www.bibsonomy.org/bibtex/2c5002e8f4a35736154c0dc3afda69fa9/dblp}, ee = {https://doi.org/10.1007/s10836-010-5177-4}, interhash = {29408664694d2a605d54d5f423ecc206}, intrahash = {c5002e8f4a35736154c0dc3afda69fa9}, journal = {J. Electron. Test.}, keywords = {dblp}, number = 6, pages = {667-677}, timestamp = {2020-09-12T11:40:15.000+0200}, title = {Chiba Scan Delay Fault Testing with Short Test Application Time.}, url = {http://dblp.uni-trier.de/db/journals/et/et26.html#NambaI10}, volume = 26, year = 2010 }