%0 Conference Paper %1 conf/itc/SrinivasanGB93 %A Srinivasan, Rajagopalan %A Gupta, Sandeep K. %A Breuer, Melvin A. %B ITC %D 1993 %I IEEE Computer Society %K dblp %P 1041-1050 %T Novel Test Pattern Generators for Pseudo-Exhaustive Testing. %U http://dblp.uni-trier.de/db/conf/itc/itc1993.html#SrinivasanGB93 %@ 0-7803-1430-1

@inproceedings{conf/itc/SrinivasanGB93, added-at = {2023-09-21T00:00:00.000+0200}, author = {Srinivasan, Rajagopalan and Gupta, Sandeep K. and Breuer, Melvin A.}, biburl = {https://www.bibsonomy.org/bibtex/27557ce46423405a3962847b0ef5d2746/dblp}, booktitle = {ITC}, crossref = {conf/itc/1993}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.1993.470594}, interhash = {2e497a2f2341c11deba1de3706f9f970}, intrahash = {7557ce46423405a3962847b0ef5d2746}, isbn = {0-7803-1430-1}, keywords = {dblp}, pages = {1041-1050}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T19:52:11.000+0200}, title = {Novel Test Pattern Generators for Pseudo-Exhaustive Testing.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1993.html#SrinivasanGB93}, year = 1993 }