%0 Conference Paper %1 conf/ats/IchiharaIOHF05 %A Ichihara, Hideyuki %A Inoue, Tomoo %A Okamoto, Naoki %A Hosokawa, Toshinori %A Fujiwara, Hideo %B Asian Test Symposium %D 2005 %I IEEE Computer Society %K dblp %P 288-293 %T An Effective Design for Hierarchical Test Generation Based on Strong Testability. %U http://dblp.uni-trier.de/db/conf/ats/ats2005.html#IchiharaIOHF05 %@ 0-7695-2481-8

@inproceedings{conf/ats/IchiharaIOHF05, added-at = {2023-03-24T00:00:00.000+0100}, author = {Ichihara, Hideyuki and Inoue, Tomoo and Okamoto, Naoki and Hosokawa, Toshinori and Fujiwara, Hideo}, biburl = {https://www.bibsonomy.org/bibtex/2e4f7b69309097e2c49518aa367423b15/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2005}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2005.23}, interhash = {3203045b78f6c465099074dcdfbb582e}, intrahash = {e4f7b69309097e2c49518aa367423b15}, isbn = {0-7695-2481-8}, keywords = {dblp}, pages = {288-293}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:36:05.000+0200}, title = {An Effective Design for Hierarchical Test Generation Based on Strong Testability.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2005.html#IchiharaIOHF05}, year = 2005 }