%0 Conference Paper %1 conf/vlsid/KunduCSK12 %A Kundu, Subhadip %A Chattopadhyay, Santanu %A Sengupta, Indranil %A Kapur, Rohit %B VLSI Design %D 2012 %E Agrawal, Vishwani D. %E Chakradhar, Srimat T. %I IEEE Computer Society %K dblp %P 436-441 %T A Diagnosability Metric for Test Set Selection Targeting Better Fault Detection. %U http://dblp.uni-trier.de/db/conf/vlsid/vlsid2012.html#KunduCSK12 %@ 978-1-4673-0438-2

@inproceedings{conf/vlsid/KunduCSK12, added-at = {2023-03-24T00:00:00.000+0100}, author = {Kundu, Subhadip and Chattopadhyay, Santanu and Sengupta, Indranil and Kapur, Rohit}, biburl = {https://www.bibsonomy.org/bibtex/23faa62f9acef7f1665c4c3d4ddb5786d/dblp}, booktitle = {VLSI Design}, crossref = {conf/vlsid/2012}, editor = {Agrawal, Vishwani D. and Chakradhar, Srimat T.}, ee = {https://doi.ieeecomputersociety.org/10.1109/VLSID.2012.110}, interhash = {329e83569157832afa106a6a18a51ed5}, intrahash = {3faa62f9acef7f1665c4c3d4ddb5786d}, isbn = {978-1-4673-0438-2}, keywords = {dblp}, pages = {436-441}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T01:05:21.000+0200}, title = {A Diagnosability Metric for Test Set Selection Targeting Better Fault Detection.}, url = {http://dblp.uni-trier.de/db/conf/vlsid/vlsid2012.html#KunduCSK12}, year = 2012 }