%0 Journal Article %1 journals/mr/StathisRL03 %A Stathis, James H. %A Rodríguez, Rosana %A Linder, Barry P. %D 2003 %J Microelectron. Reliab. %K dblp %N 8 %P 1193-1197 %T Circuit implications of gate oxide breakdown. %U http://dblp.uni-trier.de/db/journals/mr/mr43.html#StathisRL03 %V 43

@article{journals/mr/StathisRL03, added-at = {2020-02-22T00:00:00.000+0100}, author = {Stathis, James H. and Rodríguez, Rosana and Linder, Barry P.}, biburl = {https://www.bibsonomy.org/bibtex/24aab04f4c3906eea3cdad253e61b6d2a/dblp}, ee = {https://doi.org/10.1016/S0026-2714(03)00171-9}, interhash = {334cfb76bbd84effb691d044b0458a08}, intrahash = {4aab04f4c3906eea3cdad253e61b6d2a}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 8, pages = {1193-1197}, timestamp = {2020-02-25T13:28:18.000+0100}, title = {Circuit implications of gate oxide breakdown.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr43.html#StathisRL03}, volume = 43, year = 2003 }