%0 Journal Article %1 journals/tvlsi/TailleferR05 %A Taillefer, Christopher S. %A Roberts, Gordon W. %D 2005 %J IEEE Trans. Very Large Scale Integr. Syst. %K dblp %N 7 %P 852-860 %T Reducing Measurement Uncertainty in a DSP-Based Mixed-Signal Test Environment Without Increasing Test Time. %U http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi13.html#TailleferR05 %V 13

@article{journals/tvlsi/TailleferR05, added-at = {2020-03-11T00:00:00.000+0100}, author = {Taillefer, Christopher S. and Roberts, Gordon W.}, biburl = {https://www.bibsonomy.org/bibtex/2e1a7f343007836fc693d6cc5f86a1119/dblp}, ee = {https://doi.org/10.1109/TVLSI.2005.850113}, interhash = {3466762ecd53037f18c15d6584fb3e31}, intrahash = {e1a7f343007836fc693d6cc5f86a1119}, journal = {IEEE Trans. Very Large Scale Integr. Syst.}, keywords = {dblp}, number = 7, pages = {852-860}, timestamp = {2020-03-12T11:42:08.000+0100}, title = {Reducing Measurement Uncertainty in a DSP-Based Mixed-Signal Test Environment Without Increasing Test Time.}, url = {http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi13.html#TailleferR05}, volume = 13, year = 2005 }