%0 Conference Paper %1 conf/esscirc/EberleinP19 %A Eberlein, Matthias %A Pretl, Harald %B ESSCIRC %D 2019 %I IEEE %K dblp %P 63-66 %T A No-Trim, Scaling-Friendly Thermal Sensor in 16nm FinFET Using Bulk Diodes as Sensing Elements. %U http://dblp.uni-trier.de/db/conf/esscirc/esscirc2019.html#EberleinP19 %@ 978-1-7281-1550-4

@inproceedings{conf/esscirc/EberleinP19, added-at = {2020-06-15T00:00:00.000+0200}, author = {Eberlein, Matthias and Pretl, Harald}, biburl = {https://www.bibsonomy.org/bibtex/2d704cd966fad643939fef5def7504dff/dblp}, booktitle = {ESSCIRC}, crossref = {conf/esscirc/2019}, ee = {https://doi.org/10.1109/ESSCIRC.2019.8902928}, interhash = {350c79eda04ca06609cd2432e36c2de4}, intrahash = {d704cd966fad643939fef5def7504dff}, isbn = {978-1-7281-1550-4}, keywords = {dblp}, pages = {63-66}, publisher = {IEEE}, timestamp = {2020-06-16T13:08:48.000+0200}, title = {A No-Trim, Scaling-Friendly Thermal Sensor in 16nm FinFET Using Bulk Diodes as Sensing Elements.}, url = {http://dblp.uni-trier.de/db/conf/esscirc/esscirc2019.html#EberleinP19}, year = 2019 }