%0 Journal Article %1 journals/mr/MarrasMVC05 %A Marras, Alessandro %A Munari, Ilaria De %A Vescovi, Davide %A Ciampolini, Paolo %D 2005 %J Microelectron. Reliab. %K dblp %N 3-4 %P 499-506 %T Impact of gate-leakage currents on CMOS circuit performance. %U http://dblp.uni-trier.de/db/journals/mr/mr45.html#MarrasMVC05 %V 45

@article{journals/mr/MarrasMVC05, added-at = {2020-02-22T00:00:00.000+0100}, author = {Marras, Alessandro and Munari, Ilaria De and Vescovi, Davide and Ciampolini, Paolo}, biburl = {https://www.bibsonomy.org/bibtex/2b5a15a7fc3bc35dde587562110ee12bd/dblp}, ee = {https://doi.org/10.1016/j.microrel.2004.09.006}, interhash = {35c325c85782a24daf8cb756fbd0ceaf}, intrahash = {b5a15a7fc3bc35dde587562110ee12bd}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {3-4}, pages = {499-506}, timestamp = {2020-02-25T13:25:15.000+0100}, title = {Impact of gate-leakage currents on CMOS circuit performance.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr45.html#MarrasMVC05}, volume = 45, year = 2005 }