%0 Conference Paper %1 conf/itc/AdilettaCG85 %A Adiletta, Matthew %A Cooper, Elizabeth M. %A Gutfreund, Keith %B ITC %D 1985 %I IEEE Computer Society %K dblp %P 40-44 %T Automatic Test Generation for Generic Scan Designs. %U http://dblp.uni-trier.de/db/conf/itc/itc1985.html#AdilettaCG85

@inproceedings{conf/itc/AdilettaCG85, added-at = {2002-11-11T00:00:00.000+0100}, author = {Adiletta, Matthew and Cooper, Elizabeth M. and Gutfreund, Keith}, biburl = {https://www.bibsonomy.org/bibtex/2ecebdb714692f55bfd62eb00562b4502/dblp}, booktitle = {ITC}, crossref = {conf/itc/1985}, date = {2002-11-11}, description = {dblp}, interhash = {38cbec226d1b599c9f9799bdf3deb233}, intrahash = {ecebdb714692f55bfd62eb00562b4502}, keywords = {dblp}, pages = {40-44}, publisher = {IEEE Computer Society}, timestamp = {2002-11-11T00:00:00.000+0100}, title = {Automatic Test Generation for Generic Scan Designs.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1985.html#AdilettaCG85}, year = 1985 }