%0 Conference Paper %1 conf/smacd/SandruBDBP19 %A Sandru, Elena-Diana %A Burileanu, Corneliu %A David, Emilian %A Buzo, Andi %A Pelz, Georg %B SMACD %D 2019 %I IEEE %K dblp %P 237-240 %T Modeling the Dependencies between Circuit and Technology Parameters for Sensitivity Analysis using Machine Learning Techniques. %U http://dblp.uni-trier.de/db/conf/smacd/smacd2019.html#SandruBDBP19 %@ 978-1-7281-1201-5

@inproceedings{conf/smacd/SandruBDBP19, added-at = {2022-04-09T00:00:00.000+0200}, author = {Sandru, Elena-Diana and Burileanu, Corneliu and David, Emilian and Buzo, Andi and Pelz, Georg}, biburl = {https://www.bibsonomy.org/bibtex/2c2eca336dd3291af5f033ad2f3a81e57/dblp}, booktitle = {SMACD}, crossref = {conf/smacd/2019}, ee = {https://doi.org/10.1109/SMACD.2019.8795266}, interhash = {38d283703a5c7861ebc7937062a52b28}, intrahash = {c2eca336dd3291af5f033ad2f3a81e57}, isbn = {978-1-7281-1201-5}, keywords = {dblp}, pages = {237-240}, publisher = {IEEE}, timestamp = {2024-04-10T08:26:54.000+0200}, title = {Modeling the Dependencies between Circuit and Technology Parameters for Sensitivity Analysis using Machine Learning Techniques.}, url = {http://dblp.uni-trier.de/db/conf/smacd/smacd2019.html#SandruBDBP19}, year = 2019 }