%0 Journal Article %1 journals/mr/WrachienLRDSTMM15 %A Wrachien, Nicola %A Lago, Nicolò %A Rizzo, Antonio %A D'Alpaos, Riccardo %A Stefani, Andrea %A Turatti, Guido %A Muccini, Michele %A Meneghesso, Gaudenzio %A Cester, Andrea %D 2015 %J Microelectron. Reliab. %K dblp %N 9-10 %P 1790-1794 %T Effects of thermal and electrical stress on DH4T-based organic thin-film-transistors with PMMA gate dielectrics. %U http://dblp.uni-trier.de/db/journals/mr/mr55.html#WrachienLRDSTMM15 %V 55

@article{journals/mr/WrachienLRDSTMM15, added-at = {2021-10-14T00:00:00.000+0200}, author = {Wrachien, Nicola and Lago, Nicolò and Rizzo, Antonio and D'Alpaos, Riccardo and Stefani, Andrea and Turatti, Guido and Muccini, Michele and Meneghesso, Gaudenzio and Cester, Andrea}, biburl = {https://www.bibsonomy.org/bibtex/290b2be165051a20ba72bd3eceba906cf/dblp}, ee = {https://doi.org/10.1016/j.microrel.2015.06.073}, interhash = {39e71bbdc831253122932d401ee81567}, intrahash = {90b2be165051a20ba72bd3eceba906cf}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-10}, pages = {1790-1794}, timestamp = {2024-04-09T02:50:36.000+0200}, title = {Effects of thermal and electrical stress on DH4T-based organic thin-film-transistors with PMMA gate dielectrics.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr55.html#WrachienLRDSTMM15}, volume = 55, year = 2015 }