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%0 Conference Paper
%1 conf/iccd/MarchokM96
%A Marchok, Thomas E.
%A Maly, Wojciech
%B ICCD
%D 1996
%I IEEE Computer Society
%K dblp
%P 261-271
%T Modeling the Difficulty of Sequential Automatic Test Pattern Generation.
%U http://dblp.uni-trier.de/db/conf/iccd/iccd1996.html#MarchokM96
%@ 0-8186-7554-3
@inproceedings{conf/iccd/MarchokM96,
added-at = {2023-03-23T00:00:00.000+0100},
author = {Marchok, Thomas E. and Maly, Wojciech},
biburl = {https://www.bibsonomy.org/bibtex/24f2b6e106da8ff445ae0fdfb144b59af/dblp},
booktitle = {ICCD},
crossref = {conf/iccd/1996},
ee = {https://doi.ieeecomputersociety.org/10.1109/ICCD.1996.563566},
interhash = {3a084dd571232a9fe8bd2488237e1e58},
intrahash = {4f2b6e106da8ff445ae0fdfb144b59af},
isbn = {0-8186-7554-3},
keywords = {dblp},
pages = {261-271},
publisher = {IEEE Computer Society},
timestamp = {2024-04-10T21:59:17.000+0200},
title = {Modeling the Difficulty of Sequential Automatic Test Pattern Generation.},
url = {http://dblp.uni-trier.de/db/conf/iccd/iccd1996.html#MarchokM96},
year = 1996
}