%0 Journal Article %1 journals/mr/SchleiferCN11 %A Schleifer, Jochen %A Coenen, Thomas %A Noll, Tobias G. %D 2011 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1469-1473 %T Statistical modeling of reliability in logic devices. %U http://dblp.uni-trier.de/db/journals/mr/mr51.html#SchleiferCN11 %V 51

@article{journals/mr/SchleiferCN11, added-at = {2020-02-22T00:00:00.000+0100}, author = {Schleifer, Jochen and Coenen, Thomas and Noll, Tobias G.}, biburl = {https://www.bibsonomy.org/bibtex/273e05db2cf52a05098fee93b1e09985b/dblp}, ee = {https://doi.org/10.1016/j.microrel.2011.07.004}, interhash = {3bdbe49011831bdd0b7024fa01763950}, intrahash = {73e05db2cf52a05098fee93b1e09985b}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1469-1473}, timestamp = {2020-02-25T13:25:30.000+0100}, title = {Statistical modeling of reliability in logic devices.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr51.html#SchleiferCN11}, volume = 51, year = 2011 }