%0 Journal Article %1 journals/mr/ReinerNS04 %A Reiner, Joachim C. %A Nellen, Philipp %A Sennhauser, Urs %D 2004 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1583-1588 %T Gallium Artefacts on FIB-milled Silicon Samples. %U http://dblp.uni-trier.de/db/journals/mr/mr44.html#ReinerNS04 %V 44

@article{journals/mr/ReinerNS04, added-at = {2020-02-22T00:00:00.000+0100}, author = {Reiner, Joachim C. and Nellen, Philipp and Sennhauser, Urs}, biburl = {https://www.bibsonomy.org/bibtex/25e02659df5e857deb87e02290bf94947/dblp}, ee = {https://doi.org/10.1016/j.microrel.2004.07.073}, interhash = {43d07bdd36b7bbb44fd1ae3b09f11fea}, intrahash = {5e02659df5e857deb87e02290bf94947}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1583-1588}, timestamp = {2020-02-25T13:22:48.000+0100}, title = {Gallium Artefacts on FIB-milled Silicon Samples.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr44.html#ReinerNS04}, volume = 44, year = 2004 }