Article,
Automating Stressmark Generation for Testing Processor Voltage Fluctuations.
Y. Kim, L. John, S. Pant, S. Manne, M. Schulte, W. Bircher, and M. Govindan.IEEE Micro, 33 (4): 66-75 (2013)
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- journals/micro/KimJPMSBG13
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- article
- year
- 2013
- journal
- IEEE Micro
- number
- 4
- pages
- 66-75
- volume
- 33
- ee
- http://doi.ieeecomputersociety.org/10.1109/MM.2013.70
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- http://dblp.uni-trier.de/db/journals/micro/micro33.html#KimJPMSBG13
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- please select -%0 Journal Article
%1 journals/micro/KimJPMSBG13
%A Kim, Youngtaek
%A John, Lizy Kurian
%A Pant, Sanjay
%A Manne, Srilatha
%A Schulte, Michael J.
%A Bircher, William Lloyd
%A Govindan, Madhu Saravana Sibi
%D 2013
%J IEEE Micro
%K dblp
%N 4
%P 66-75
%T Automating Stressmark Generation for Testing Processor Voltage Fluctuations.
%U http://dblp.uni-trier.de/db/journals/micro/micro33.html#KimJPMSBG13
%V 33
@article{journals/micro/KimJPMSBG13,
added-at = {2015-12-09T00:00:00.000+0100},
author = {Kim, Youngtaek and John, Lizy Kurian and Pant, Sanjay and Manne, Srilatha and Schulte, Michael J. and Bircher, William Lloyd and Govindan, Madhu Saravana Sibi},
biburl = {https://www.bibsonomy.org/bibtex/283b29f87539431025c6d151fc8d65c0e/dblp},
ee = {http://doi.ieeecomputersociety.org/10.1109/MM.2013.70},
interhash = {4715e4a98d59441edbcee524375e7660},
intrahash = {83b29f87539431025c6d151fc8d65c0e},
journal = {IEEE Micro},
keywords = {dblp},
number = 4,
pages = {66-75},
timestamp = {2015-12-12T11:40:16.000+0100},
title = {Automating Stressmark Generation for Testing Processor Voltage Fluctuations.},
url = {http://dblp.uni-trier.de/db/journals/micro/micro33.html#KimJPMSBG13},
volume = 33,
year = 2013
}