%0 Conference Paper %1 conf/date/JoshiLBBG13 %A Joshi, Smriti %A Lombardot, Anne %A Belleville, Marc %A Beigné, Edith %A Girard, Stéphane %B DATE %D 2013 %E Macii, Enrico %I EDA Consortium San Jose, CA, USA / ACM DL %K dblp %P 1056-1057 %T A gate level methodology for efficient statistical leakage estimation in complex 32nm circuits. %U http://dblp.uni-trier.de/db/conf/date/date2013.html#JoshiLBBG13 %@ 978-1-4503-2153-2

@inproceedings{conf/date/JoshiLBBG13, added-at = {2021-10-14T00:00:00.000+0200}, author = {Joshi, Smriti and Lombardot, Anne and Belleville, Marc and Beigné, Edith and Girard, Stéphane}, biburl = {https://www.bibsonomy.org/bibtex/2d259fcde1f438c2e24672c5f1c3e26e3/dblp}, booktitle = {DATE}, crossref = {conf/date/2013}, editor = {Macii, Enrico}, ee = {http://dl.acm.org/citation.cfm?id=2485543}, interhash = {4986514093cf9aa446b96a516199c277}, intrahash = {d259fcde1f438c2e24672c5f1c3e26e3}, isbn = {978-1-4503-2153-2}, keywords = {dblp}, pages = {1056-1057}, publisher = {EDA Consortium San Jose, CA, USA / ACM DL}, timestamp = {2024-04-10T06:49:49.000+0200}, title = {A gate level methodology for efficient statistical leakage estimation in complex 32nm circuits.}, url = {http://dblp.uni-trier.de/db/conf/date/date2013.html#JoshiLBBG13}, year = 2013 }