%0 Journal Article %1 journals/mr/AyalewGPGS03 %A Ayalew, Tesfaye %A Gehring, Andreas %A Park, Jong Mun %A Grasser, Tibor %A Selberherr, Siegfried %D 2003 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1889-1894 %T Improving SiC lateral DMOSFET reliability under high field stress. %U http://dblp.uni-trier.de/db/journals/mr/mr43.html#AyalewGPGS03 %V 43

@article{journals/mr/AyalewGPGS03, added-at = {2020-02-22T00:00:00.000+0100}, author = {Ayalew, Tesfaye and Gehring, Andreas and Park, Jong Mun and Grasser, Tibor and Selberherr, Siegfried}, biburl = {https://www.bibsonomy.org/bibtex/2eae82a93648d4e1ead098cbd3b947983/dblp}, ee = {https://www.wikidata.org/entity/Q62600402}, interhash = {4a3fd61736932b595eeb629299641382}, intrahash = {eae82a93648d4e1ead098cbd3b947983}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1889-1894}, timestamp = {2020-02-25T13:27:55.000+0100}, title = {Improving SiC lateral DMOSFET reliability under high field stress.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr43.html#AyalewGPGS03}, volume = 43, year = 2003 }