%0 Journal Article %1 journals/mj/SmithBM09 %A Smith, Brian %A Brunschwiler, Thomas %A Michel, Bruno %D 2009 %J Microelectron. J. %K dblp %N 9 %P 1379-1386 %T Comparison of transient and static test methods for chip-to-sink thermal interface characterization. %U http://dblp.uni-trier.de/db/journals/mj/mj40.html#SmithBM09 %V 40

@article{journals/mj/SmithBM09, added-at = {2020-02-22T00:00:00.000+0100}, author = {Smith, Brian and Brunschwiler, Thomas and Michel, Bruno}, biburl = {https://www.bibsonomy.org/bibtex/20f7b8ab3bea9e304220d106403ee0c84/dblp}, ee = {https://doi.org/10.1016/j.mejo.2008.06.079}, interhash = {4b4a3a2ef835d6d65a39c5a24b49966d}, intrahash = {0f7b8ab3bea9e304220d106403ee0c84}, journal = {Microelectron. J.}, keywords = {dblp}, number = 9, pages = {1379-1386}, timestamp = {2020-02-25T12:58:29.000+0100}, title = {Comparison of transient and static test methods for chip-to-sink thermal interface characterization.}, url = {http://dblp.uni-trier.de/db/journals/mj/mj40.html#SmithBM09}, volume = 40, year = 2009 }