%0 Conference Paper %1 WOS:000282068200045 %A Marulanda, J I %A Lima, R A A %A Carvalho, M C R %A Almeida, A F L %A Sombra, A B S %A Demenicis, L S %B 2009 SBMO/IEEE MTT-S INTERNATIONAL MICROWAVE AND OPTOELECTRONICS CONFERENCE (IMOC 2009) %C 345 E 47TH ST, NEW YORK, NY 10017 USA %D 2009 %I IEEE %K CTO} MTO; ceramic constant; dielectric films; high thick {microwave %P 206+ %T Characterization of dielectric properties of screen-printed MgTiO3-CaTiO3 composite thick films in the microwave frequency range %X Dielectric characterization of MgTiO3, CaTiO3 and MgTiO3(x)-CaTiO3(1-x) composite thick films with different concentrations (x = 0.95, 0.50, and 0.20) in the microwave frequency range at room temperature is presented. The films were fabricated by screen-printed method with thickness between 105 and 165 mu m. Dielectric constant values between 4.2 and 17.5 and loss tangents between 0.0064 and 0.0098 were measured for frequencies in the range from 3.22 to 3.89 GHz using the coplanar waveguide (CPW) resonators technique. A relationship between the concentration ratio of MTO-CTO in the films and the dielectric constant is also presented. %@ 978-1-4244-5356-6

@inproceedings{WOS:000282068200045, abstract = {Dielectric characterization of MgTiO3, CaTiO3 and MgTiO3(x)-CaTiO3(1-x) composite thick films with different concentrations (x = 0.95, 0.50, and 0.20) in the microwave frequency range at room temperature is presented. The films were fabricated by screen-printed method with thickness between 105 and 165 mu m. Dielectric constant values between 4.2 and 17.5 and loss tangents between 0.0064 and 0.0098 were measured for frequencies in the range from 3.22 to 3.89 GHz using the coplanar waveguide (CPW) resonators technique. A relationship between the concentration ratio of MTO-CTO in the films and the dielectric constant is also presented.}, added-at = {2022-05-23T20:00:14.000+0200}, address = {345 E 47TH ST, NEW YORK, NY 10017 USA}, author = {Marulanda, J I and Lima, R A A and Carvalho, M C R and Almeida, A F L and Sombra, A B S and Demenicis, L S}, biburl = {https://www.bibsonomy.org/bibtex/2d3bfcd44ddf49e7c1576c840ba8e72eb/ppgfis_ufc_br}, booktitle = {2009 SBMO/IEEE MTT-S INTERNATIONAL MICROWAVE AND OPTOELECTRONICS CONFERENCE (IMOC 2009)}, interhash = {4d51536dc2736031e8c638a55e8910c3}, intrahash = {d3bfcd44ddf49e7c1576c840ba8e72eb}, isbn = {978-1-4244-5356-6}, keywords = {CTO} MTO; ceramic constant; dielectric films; high thick {microwave}, note = {SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference, Belem, BRAZIL, NOV 03-06, 2009}, organization = {SBMO; IEEE MTT S}, pages = {206+}, publisher = {IEEE}, pubstate = {published}, timestamp = {2022-05-23T20:00:14.000+0200}, title = {Characterization of dielectric properties of screen-printed MgTiO3-CaTiO3 composite thick films in the microwave frequency range}, tppubtype = {inproceedings}, year = 2009 }