%0 Journal Article %1 journals/tvlsi/HungLLC21 %A Hung, Shao-Chun %A Lu, Yi-Chen %A Lim, Sung Kyu %A Chakrabarty, Krishnendu %D 2021 %J IEEE Trans. Very Large Scale Integr. Syst. %K dblp %N 11 %P 1875-1888 %T Power Supply Noise-Aware At-Speed Delay Fault Testing of Monolithic 3-D ICs. %U http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi29.html#HungLLC21 %V 29

@article{journals/tvlsi/HungLLC21, added-at = {2021-12-15T00:00:00.000+0100}, author = {Hung, Shao-Chun and Lu, Yi-Chen and Lim, Sung Kyu and Chakrabarty, Krishnendu}, biburl = {https://www.bibsonomy.org/bibtex/2e67775da9f0da4f55e5421eff18a2bbe/dblp}, ee = {https://doi.org/10.1109/TVLSI.2021.3108787}, interhash = {4d9a17e744efdeb29c34cd53de9c4ec1}, intrahash = {e67775da9f0da4f55e5421eff18a2bbe}, journal = {IEEE Trans. Very Large Scale Integr. Syst.}, keywords = {dblp}, number = 11, pages = {1875-1888}, timestamp = {2024-04-08T14:32:31.000+0200}, title = {Power Supply Noise-Aware At-Speed Delay Fault Testing of Monolithic 3-D ICs.}, url = {http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi29.html#HungLLC21}, volume = 29, year = 2021 }