%0 Journal Article %1 journals/tvlsi/SilvaLSG19 %A Silva, Rafael Sanchotene %A Luiz, Lucas Pereira %A Schneider, Márcio Cherem %A Galup-Montoro, Carlos %D 2019 %J IEEE Trans. Very Large Scale Integr. Syst. %K dblp %N 8 %P 1967-1971 %T A Test Chip for Characterization of the Series Association of MOSFETs. %U http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi27.html#SilvaLSG19 %V 27

@article{journals/tvlsi/SilvaLSG19, added-at = {2020-10-26T00:00:00.000+0100}, author = {Silva, Rafael Sanchotene and Luiz, Lucas Pereira and Schneider, Márcio Cherem and Galup-Montoro, Carlos}, biburl = {https://www.bibsonomy.org/bibtex/29c888d0b8d50696e0638a5cbf0625b1f/dblp}, ee = {https://doi.org/10.1109/TVLSI.2019.2908338}, interhash = {4fbbb2f8bff26dfcb6cd83fd8ea4f361}, intrahash = {9c888d0b8d50696e0638a5cbf0625b1f}, journal = {IEEE Trans. Very Large Scale Integr. Syst.}, keywords = {dblp}, number = 8, pages = {1967-1971}, timestamp = {2020-10-27T11:55:27.000+0100}, title = {A Test Chip for Characterization of the Series Association of MOSFETs.}, url = {http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi27.html#SilvaLSG19}, volume = 27, year = 2019 }