%0 Journal Article %1 journals/eswa/ChangLCJ09 %A Chang, Chuan-Yu %A Li, ChunHsi %A Chang, Jia-Wei %A Jeng, MuDer %D 2009 %J Expert Syst. Appl. %K dblp %N 1 %P 950-958 %T An unsupervised neural network approach for automatic semiconductor wafer defect inspection. %U http://dblp.uni-trier.de/db/journals/eswa/eswa36.html#ChangLCJ09 %V 36

@article{journals/eswa/ChangLCJ09, added-at = {2009-09-09T00:00:00.000+0200}, author = {Chang, Chuan-Yu and Li, ChunHsi and Chang, Jia-Wei and Jeng, MuDer}, biburl = {https://www.bibsonomy.org/bibtex/233cc72623f0af7f301eb80648ce39f94/dblp}, date = {2009-09-09}, description = {dblp}, ee = {http://dx.doi.org/10.1016/j.eswa.2007.10.033}, interhash = {51a77be895cadf9f431670d2797f864e}, intrahash = {33cc72623f0af7f301eb80648ce39f94}, journal = {Expert Syst. Appl.}, keywords = {dblp}, number = 1, pages = {950-958}, timestamp = {2009-09-10T11:34:34.000+0200}, title = {An unsupervised neural network approach for automatic semiconductor wafer defect inspection.}, url = {http://dblp.uni-trier.de/db/journals/eswa/eswa36.html#ChangLCJ09}, volume = 36, year = 2009 }