%0 Journal Article %1 journals/et/LiuHCT03 %A Liu, Xiao %A Hsiao, Michael S. %A Chakravarty, Sreejit %A Thadikaran, Paul J. %D 2003 %J J. Electron. Test. %K dblp %N 4 %P 437-445 %T Efficient Transition Fault ATPG Algorithms Based on Stuck-At Test Vectors. %U http://dblp.uni-trier.de/db/journals/et/et19.html#LiuHCT03 %V 19

@article{journals/et/LiuHCT03, added-at = {2020-09-11T00:00:00.000+0200}, author = {Liu, Xiao and Hsiao, Michael S. and Chakravarty, Sreejit and Thadikaran, Paul J.}, biburl = {https://www.bibsonomy.org/bibtex/20810d8cf18b28a3d95174b50f6df5e8a/dblp}, ee = {https://doi.org/10.1023/A:1024696110831}, interhash = {527dd4a799f35ec3f9c4d921641263db}, intrahash = {0810d8cf18b28a3d95174b50f6df5e8a}, journal = {J. Electron. Test.}, keywords = {dblp}, number = 4, pages = {437-445}, timestamp = {2020-09-12T11:40:15.000+0200}, title = {Efficient Transition Fault ATPG Algorithms Based on Stuck-At Test Vectors.}, url = {http://dblp.uni-trier.de/db/journals/et/et19.html#LiuHCT03}, volume = 19, year = 2003 }