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%0 Journal Article
%1 journals/mr/TangMHZXLGZZ16
%A Tang, Du
%A Martin-Bragado, Ignacio
%A He, Chaohui
%A Zang, Hang
%A Xiong, Cen
%A Li, Yonghong
%A Guo, Daxi
%A Zhang, Peng
%A Zhang, Jinxin
%D 2016
%J Microelectron. Reliab.
%K dblp
%P 25-32
%T Time dependent modeling of single particle displacement damage in silicon devices.
%U http://dblp.uni-trier.de/db/journals/mr/mr60.html#TangMHZXLGZZ16
%V 60
@article{journals/mr/TangMHZXLGZZ16,
added-at = {2020-02-22T00:00:00.000+0100},
author = {Tang, Du and Martin-Bragado, Ignacio and He, Chaohui and Zang, Hang and Xiong, Cen and Li, Yonghong and Guo, Daxi and Zhang, Peng and Zhang, Jinxin},
biburl = {https://www.bibsonomy.org/bibtex/2cdc323364a2b51f69bc6c063a30e74c7/dblp},
ee = {https://doi.org/10.1016/j.microrel.2016.03.004},
interhash = {590c5a9922af41783a97cc3c85fa1776},
intrahash = {cdc323364a2b51f69bc6c063a30e74c7},
journal = {Microelectron. Reliab.},
keywords = {dblp},
pages = {25-32},
timestamp = {2020-02-25T13:23:02.000+0100},
title = {Time dependent modeling of single particle displacement damage in silicon devices.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr60.html#TangMHZXLGZZ16},
volume = 60,
year = 2016
}