%0 Journal Article %1 journals/mr/Bey-TemsamaniKD17 %A Bey-Temsamani, Abdellatif %A Kauffmann, S. %A Descas, Y. %A Vandevelde, Bart %A Zanon, Franco %A Willems, Geert %D 2017 %J Microelectron. Reliab. %K dblp %P 42-46 %T Improved and accurate physics-of-failure (PoF) methodology for qualification and lifetime assessment of electronic systems. %U http://dblp.uni-trier.de/db/journals/mr/mr76.html#Bey-TemsamaniKD17 %V 76-77

@article{journals/mr/Bey-TemsamaniKD17, added-at = {2020-02-22T00:00:00.000+0100}, author = {Bey-Temsamani, Abdellatif and Kauffmann, S. and Descas, Y. and Vandevelde, Bart and Zanon, Franco and Willems, Geert}, biburl = {https://www.bibsonomy.org/bibtex/2beb01006f16fdb1f3dbeb0a2aa7cdf67/dblp}, ee = {https://doi.org/10.1016/j.microrel.2017.06.047}, interhash = {5c862601f1112349f004df4284dff1f0}, intrahash = {beb01006f16fdb1f3dbeb0a2aa7cdf67}, journal = {Microelectron. Reliab.}, keywords = {dblp}, pages = {42-46}, timestamp = {2020-02-25T13:29:31.000+0100}, title = {Improved and accurate physics-of-failure (PoF) methodology for qualification and lifetime assessment of electronic systems.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr76.html#Bey-TemsamaniKD17}, volume = {76-77}, year = 2017 }