%0 Conference Paper %1 conf/irps/SanganiDBKG23 %A Sangani, Dishant %A Diaz-Fortuny, Javier %A Bury, Erik %A Kaczer, Ben %A Gielen, Georges G. E. %B IRPS %D 2023 %I IEEE %K dblp %P 1-6 %T The Role of Mobility Degradation in the BTI-Induced RO Aging in a 28-nm Bulk CMOS Technology: (Student paper). %U http://dblp.uni-trier.de/db/conf/irps/irps2023.html#SanganiDBKG23 %@ 978-1-6654-5672-2

@inproceedings{conf/irps/SanganiDBKG23, added-at = {2023-09-25T00:00:00.000+0200}, author = {Sangani, Dishant and Diaz-Fortuny, Javier and Bury, Erik and Kaczer, Ben and Gielen, Georges G. E.}, biburl = {https://www.bibsonomy.org/bibtex/25f4536535be7f2b192e1427e5f890ea8/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2023}, ee = {https://doi.org/10.1109/IRPS48203.2023.10118026}, interhash = {5f45e3120cbe5515f26ddc6fd77484a1}, intrahash = {5f4536535be7f2b192e1427e5f890ea8}, isbn = {978-1-6654-5672-2}, keywords = {dblp}, pages = {1-6}, publisher = {IEEE}, timestamp = {2024-04-09T12:18:52.000+0200}, title = {The Role of Mobility Degradation in the BTI-Induced RO Aging in a 28-nm Bulk CMOS Technology: (Student paper).}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2023.html#SanganiDBKG23}, year = 2023 }