Inproceedings,
Diagnosis of full open defects in interconnect lines with fan-out.
R. Rodríguez-Montañés, D. Arumí, J. Figueras, S. Eichenberger, C. Hora, and B. Kruseman.European Test Symposium, page 233-238. IEEE Computer Society, (2010)
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- conf/ets/Rodriguez-MontanesAFEHK10
- entry type
- inproceedings
- booktitle
- European Test Symposium
- year
- 2010
- pages
- 233-238
- publisher
- IEEE Computer Society
- crossref
- conf/ets/2010
- ee
- https://doi.org/10.1109/ETSYM.2010.5512752
- isbn
- 978-1-4244-5833-2
- url
- http://dblp.uni-trier.de/db/conf/ets/ets2010.html#Rodriguez-MontanesAFEHK10
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- please select -%0 Conference Paper
%1 conf/ets/Rodriguez-MontanesAFEHK10
%A Rodríguez-Montañés, Rosa
%A Arumí, Daniel
%A Figueras, Joan
%A Eichenberger, Stefan
%A Hora, Camelia
%A Kruseman, Bram
%B European Test Symposium
%D 2010
%I IEEE Computer Society
%K dblp
%P 233-238
%T Diagnosis of full open defects in interconnect lines with fan-out.
%U http://dblp.uni-trier.de/db/conf/ets/ets2010.html#Rodriguez-MontanesAFEHK10
%@ 978-1-4244-5833-2
@inproceedings{conf/ets/Rodriguez-MontanesAFEHK10,
added-at = {2019-10-19T00:00:00.000+0200},
author = {Rodríguez-Montañés, Rosa and Arumí, Daniel and Figueras, Joan and Eichenberger, Stefan and Hora, Camelia and Kruseman, Bram},
biburl = {https://www.bibsonomy.org/bibtex/249428eb49a288be6db766c5af373d69f/dblp},
booktitle = {European Test Symposium},
crossref = {conf/ets/2010},
ee = {https://doi.org/10.1109/ETSYM.2010.5512752},
interhash = {613af26b6dd76b6bf765507d4329dbfa},
intrahash = {49428eb49a288be6db766c5af373d69f},
isbn = {978-1-4244-5833-2},
keywords = {dblp},
pages = {233-238},
publisher = {IEEE Computer Society},
timestamp = {2019-10-22T15:56:58.000+0200},
title = {Diagnosis of full open defects in interconnect lines with fan-out.},
url = {http://dblp.uni-trier.de/db/conf/ets/ets2010.html#Rodriguez-MontanesAFEHK10},
year = 2010
}