%0 Journal Article %1 journals/tcad/ChangLHLR13 %A Chang, Chia-Yuan %A Liao, Kuan-Yu %A Hsu, Sheng-Chang %A Li, James Chien-Mo %A Rau, Jiann-Chyi %D 2013 %J IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. %K dblp %N 6 %P 971-975 %T Compact Test Pattern Selection for Small Delay Defect. %U http://dblp.uni-trier.de/db/journals/tcad/tcad32.html#ChangLHLR13 %V 32

@article{journals/tcad/ChangLHLR13, added-at = {2020-09-24T00:00:00.000+0200}, author = {Chang, Chia-Yuan and Liao, Kuan-Yu and Hsu, Sheng-Chang and Li, James Chien-Mo and Rau, Jiann-Chyi}, biburl = {https://www.bibsonomy.org/bibtex/20cc978426721d42fcd2926c4d8ae04f3/dblp}, ee = {https://doi.org/10.1109/TCAD.2013.2237946}, interhash = {6393b63f116902d65a11f7181651a37f}, intrahash = {0cc978426721d42fcd2926c4d8ae04f3}, journal = {IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.}, keywords = {dblp}, number = 6, pages = {971-975}, timestamp = {2020-09-25T11:47:40.000+0200}, title = {Compact Test Pattern Selection for Small Delay Defect.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad32.html#ChangLHLR13}, volume = 32, year = 2013 }