%0 Journal Article %1 journals/mr/BroasGSPAJB16 %A Broas, Mikael %A Graff, Andreas %A Simon-Najasek, Michél %A Poppitz, David %A Altmann, Frank %A Jung, Helmut %A Blanck, Hervé %D 2016 %J Microelectron. Reliab. %K dblp %P 541-546 %T Correlation of gate leakage and local strain distribution in GaN/AlGaN HEMT structures. %U http://dblp.uni-trier.de/db/journals/mr/mr64.html#BroasGSPAJB16 %V 64

@article{journals/mr/BroasGSPAJB16, added-at = {2024-05-07T00:00:00.000+0200}, author = {Broas, Mikael and Graff, Andreas and Simon-Najasek, Michél and Poppitz, David and Altmann, Frank and Jung, Helmut and Blanck, Hervé}, biburl = {https://www.bibsonomy.org/bibtex/21c1ffd0e17c7bea55018a994d2c5afd2/dblp}, ee = {https://doi.org/10.1016/j.microrel.2016.07.050}, interhash = {6421154af478bbd1c5403f1a9346a1a4}, intrahash = {1c1ffd0e17c7bea55018a994d2c5afd2}, journal = {Microelectron. Reliab.}, keywords = {dblp}, pages = {541-546}, timestamp = {2024-05-13T07:47:56.000+0200}, title = {Correlation of gate leakage and local strain distribution in GaN/AlGaN HEMT structures.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr64.html#BroasGSPAJB16}, volume = 64, year = 2016 }