%0 Journal Article %1 journals/tc/LinCYHCH13 %A Lin, Chen-Wei %A Chen, Hung-Hsin %A Yang, Hao-Yu %A Huang, Chin-Yuan %A Chao, Mango Chia-Tso %A Huang, Rei-Fu %D 2013 %J IEEE Trans. Computers %K dblp %N 3 %P 468-481 %T Fault Models and Test Methods for Subthreshold SRAMs. %U http://dblp.uni-trier.de/db/journals/tc/tc62.html#LinCYHCH13 %V 62

@article{journals/tc/LinCYHCH13, added-at = {2015-12-22T00:00:00.000+0100}, author = {Lin, Chen-Wei and Chen, Hung-Hsin and Yang, Hao-Yu and Huang, Chin-Yuan and Chao, Mango Chia-Tso and Huang, Rei-Fu}, biburl = {https://www.bibsonomy.org/bibtex/258ebe75f5aff88a0909836d18f8615bf/dblp}, ee = {http://doi.ieeecomputersociety.org/10.1109/TC.2011.252}, interhash = {64f29af517da177c62f2f4d1bcb739d2}, intrahash = {58ebe75f5aff88a0909836d18f8615bf}, journal = {IEEE Trans. Computers}, keywords = {dblp}, number = 3, pages = {468-481}, timestamp = {2015-12-24T11:53:53.000+0100}, title = {Fault Models and Test Methods for Subthreshold SRAMs.}, url = {http://dblp.uni-trier.de/db/journals/tc/tc62.html#LinCYHCH13}, volume = 62, year = 2013 }