%0 Conference Paper %1 conf/iecon/RenSG16 %A Ren, Lei %A Shen, Qian %A Gong, Chunying %B IECON %D 2016 %I IEEE %K dblp %P 441-446 %T Real-time aging monitoring for power MOSFETs using threshold voltage. %U http://dblp.uni-trier.de/db/conf/iecon/iecon2016.html#RenSG16 %@ 978-1-5090-3474-1

@inproceedings{conf/iecon/RenSG16, added-at = {2018-02-26T00:00:00.000+0100}, author = {Ren, Lei and Shen, Qian and Gong, Chunying}, biburl = {https://www.bibsonomy.org/bibtex/20c87c2ec08748b9678bcf6c74d3bfd42/dblp}, booktitle = {IECON}, crossref = {conf/iecon/2016}, ee = {https://doi.org/10.1109/IECON.2016.7793625}, interhash = {658ba2cb3cf68215dda5fda9951493ad}, intrahash = {0c87c2ec08748b9678bcf6c74d3bfd42}, isbn = {978-1-5090-3474-1}, keywords = {dblp}, pages = {441-446}, publisher = {IEEE}, timestamp = {2019-10-17T21:28:25.000+0200}, title = {Real-time aging monitoring for power MOSFETs using threshold voltage.}, url = {http://dblp.uni-trier.de/db/conf/iecon/iecon2016.html#RenSG16}, year = 2016 }