%0 Conference Paper %1 conf/irps/IgarashiUTTSN18 %A Igarashi, Mitsuhiko %A Uchida, Yuuki %A Takazawa, Yoshio %A Tsukamoto, Yasumasa %A Shibutani, Koji %A Nii, Koji %B IRPS %D 2018 %I IEEE %K dblp %P 1 %T Study of impact of BTI's local layout effect including recovery effect on various standard-cells in 10nm FinFET. %U http://dblp.uni-trier.de/db/conf/irps/irps2018.html#IgarashiUTTSN18 %@ 978-1-5386-5479-8

@inproceedings{conf/irps/IgarashiUTTSN18, added-at = {2019-01-22T00:00:00.000+0100}, author = {Igarashi, Mitsuhiko and Uchida, Yuuki and Takazawa, Yoshio and Tsukamoto, Yasumasa and Shibutani, Koji and Nii, Koji}, biburl = {https://www.bibsonomy.org/bibtex/2337af413f712fb52a930c7fdbed8c769/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2018}, ee = {https://doi.org/10.1109/IRPS.2018.8353654}, interhash = {66f35dc929b6fa587140e43f93ef52c3}, intrahash = {337af413f712fb52a930c7fdbed8c769}, isbn = {978-1-5386-5479-8}, keywords = {dblp}, pages = 1, publisher = {IEEE}, timestamp = {2019-10-17T14:45:36.000+0200}, title = {Study of impact of BTI's local layout effect including recovery effect on various standard-cells in 10nm FinFET.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2018.html#IgarashiUTTSN18}, year = 2018 }